JaCoW Logo

Reference Search

3rd Int. Beam Instrumentation Conf. (IBIC'14)

Monterey, CA, USA, Sep. 2014


References


Reference
K. B. Scheidt, “Non-Destructive Vertical Halo Monitor on the ESRF's 6GeV Electron Beam”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOCYB1, pp. 2-6.
R. Takai et al., “Design and Initial Commissioning of Beam Diagnostics for the KEK Compact ERL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOCYB2, pp. 7-11.
A. P. Zhukov, A. V. Aleksandrov, and Y. Liu, “Longitudinal Laser Wire at SNS”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOCYB3, pp. 12-15.
C. M. Caselle et al., “A Picosecond Sampling Electronic ``KAPTURE'' for Terahertz Synchrotron Radiation”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOCZB1, pp. 24-28.
S. Hunziker et al., “Reference Distribution and Synchronization System for SwissFEL: Concept and First Results”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOCZB2, pp. 29-33.
M. Heuer, S. Pfeiffer, H. Schlarb, and G. Lichtenberg, “Comparison of Feedback Controller for Link Stabilizing Units of the Laser Based Synchronisation System used at the European XFEL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOCZB3, pp. 34-38.
S. R. Smith, “Welcome to the 2014 International Beam Instrumentation Conference”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOIXB1, pp. XX-XX.
W. X. Cheng et al., “NSLS2 Diagnostic Systems Commissioning and Measurements”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOIZB1, pp. 16-23.
H. Huang et al., “RHIC p-Carbon Polarimeter Target Lifetime Issue”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPD01, pp. 124-128.
P. Thieberger et al., “The Electron Backscattering Detector (eBSD), a New Tool for the Precise Mutual Alignment of the Electron and Ion Beams in Electron Lenses”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPD02, pp. 129-133.

Back to the list