5th Int. Beam Instrumentation Conf. (IBIC'16)
Barcelona, Spain, Sep. 2016
References
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Reference
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M. Liu, X. L. Dai, and C. X. Yin, “Stable Transmission of RF Signals and Timing Events With Accuracy at Femtoseconds”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 491-493. |
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A. A. Tishchenko and D. Yu. Sergeeva, “X-Ray Smith-Purcell Radiation for Non-Invasive Submicron Diagnostics of Electron Beams Having TeV Energy”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 494-497. |
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I. Nozawa, M. Gohdo, K. Kan, T. Kondoh, J. Yang, and Y. Yoshida, “Bunch Length Measurement Based on Interferometric Technique by Observing Coherent Transition Radiation”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 498-500. |
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V. A. Verzilov and P. E. Dirksen, “OTR Measurements with Sub-MeV Electrons”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 501-503. |
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B. X. Yang, S. H. Lee, J. W. Morgan, and H. Shang, “High-Energy X-Ray Pinhole Camera for High-Resolution Electron Beam Size Measurements”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 504-507. |
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O. I. Meshkov et al., “Recent Results From New Station for Optical Observation of Electron Beam Parameters at KCSR Storage Ring”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 508-511. |
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E. Rojatti, G. M. A. Calvi, L. Lanzavecchia, A. Parravicini, and C. Viviani, “Study of the Radiation Damage on a Scintillating Fibers Based Beam Profile Monitor”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 512-515. |
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A. Lieberwirth et al., “Test of the Imaging Properties of Inorganic Scintillation Screens Using Fast and Slow Extracted Ion Beams”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 516-519. |
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M. Sapinski et al., “Ionization Profile Monitor Simulations - Status and Future Plans”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 520-523. |
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E. Mulyani and J. W. Flanagan, “Calibration of X-ray Monitor during the Phase I of SuperKEKB commissioning”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 524-527. |
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