5th Int. Beam Instrumentation Conf. (IBIC'16)
Barcelona, Spain, Sep. 2016
References
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Reference
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M. Gasior, G. Baud, J. Olexa, and G. Valentino, “First Operational Experience with the LHC Diode ORbit and OScillation (DOROS) System”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 43-46. |
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Z. Sorrell, P. Cerniglia, R. L. Hulsart, K. Mernick, and R. J. Michnoff, “Beam Position Monitors for LEReC”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 47-50. |
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E. Plouviez and F. Uberto, “The Orbit Correction Scheme of the New EBS of the ESRF”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 51-54. |
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R. M. Lill, N. Sereno, and B. X. Yang, “BPM Stabiltiy Studies for the APS MBA Upgrade”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 55-58. |
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P. C. Chiu, Y.-S. Cheng, K. T. Hsu, K. H. Hu, and C. H. Huang, “Beam Commissioning of TPS Fast Orbit Feedback System”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 59-62. |
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S. Zorzetti et al., “A Wire-Based Methodology to Analyse the Nanometric Resolution of an RF Cavity BPM”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 63-66. |
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K. P. Przygoda et al., “MicroTCA.4 Based Optical Frontend Readout Electronics and its Applications”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 67-70. |
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E. Griesmayer, P. Kavrigin, Ch. Weiss, and C. Bloomer, “The Use of Single-crystal CVD Diamond as a Position Sensitive X-ray Detector”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 71-74. |
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U. Lehnert, A. Buechner, B. Lange, R. Schurig, and R. Steinbr?â, “BPM Electronics for the ELBE Linear Accelerator - a Comparison”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 75-77. |
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B. X. Yang et al., “Performance Test of the Next Generation X-Ray Beam Position Monitor System for the APS Upgrade”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 78-81. |
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