5th Int. Beam Instrumentation Conf. (IBIC'16)
Barcelona, Spain, Sep. 2016
References
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Reference
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E. Janas, K. Czuba, U. Mavric, and H. Schlarb, “Temperature and Humidity Drift Characterization of Passive RF Components for a Two-Tone Calibration Method”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 194-197. |
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R. B. Fiorito, C. P. Welsch, C. I. Clarke, A. S. Fisher, and A. G. Shkvarunets, “Coherent Diffraction Radiation Imaging Methods to Measure RMS Bunch”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 198-200. |
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L. Torino and U. Iriso, “Time Correlated Single Photon Counting Using Different Photon Detectors”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 201-204. |
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O. I. Meshkov et al., “Development, Calibration and Application of New-Generation Dissectors With Picosecond Temporal Resolution”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 205-208. |
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M. Labat, M. El Ajjouri, N. Hubert, D. Pedeau, M. Ribbens, and M.-A. Tordeux, “AXD Measurements at SOLEIL”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 209-212. |
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A. J. Lancaster, G. Doucas, H. Harrison, and I. V. Konoplev, “Novel Grating Designs for a Single-Shot Smith-Purcell Bunch Profile Monitor”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 213-216. |
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M. L. Chen et al., “Recent Beam Size Measurement Result Using Synchrotron Radiation Inteferometer in TPS”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 217-220. |
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P. Valente, B. Buonomo, D. G. C. Di Giulio, and L. G. Foggetta, “Frascati Beam-Test Facility (BTF) High Resolution Beam Spot Diagnostics”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 221-224. |
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G. L. Orlandi, R. Ischebeck, C. Ozkan Loch, V. Schlott, M. Ferianis, and G. Penco, “Design and Experimental Tests of the SwissFEL Wire-Scanners”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 225-228. |
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N. T. Rider et al., “Development and Commissioning of the Next Generation X-ray Beam Size Monitor in CESR”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 229-232. |
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