5th Int. Beam Instrumentation Conf. (IBIC'16)
Barcelona, Spain, Sep. 2016
References
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Reference
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Z. Sorrell, P. Cerniglia, R. L. Hulsart, K. Mernick, and R. J. Michnoff, “Beam Position Monitors for LEReC”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 47-50. |
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Z. Altinbas, R. F. Lambiase, and C. Theisen, “Blip Scanning System Power Supply Control”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 406-409. |
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Y.-S. Cheng, K. T. Hsu, K. H. Hu, C. H. Huang, and C. Y. Liao, “Commissioning of the Bunch-by-Bunch Transverse Feedback System for the TPS Storage Ring”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 612-615. |
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Y. Valdau, S. Mikirtytchiants, S. Trusov, L. Eltcov, and P. Wuestner, “Development of High Resolution Beam Current Measurement System for COSY-J??lich”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 434-437. |
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Y. Nakanishi et al., “Measurement of the Beam Response to Quadrupole Kick by Using Stripline Pickup Monitor at J-PARC Main Ring”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 604-607. |
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Y. E. Tan, D. J. Peake, and D. O. Tavares, “Fast Orbit Feedback with Linux PREEMPT_RT”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 630-633. |
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W. J. Corbett et al., “Transverse Beam Profiling and Vertical Emittance Control with a Double-Slit Stellar Interferometer”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 236-239. |
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W. Andreazza et al., “The Design, Construction and Operation of the Beam Instrumentation for the High Intensity and Energy Upgrade of ISOLDE at CERN”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 101-104. |
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V. Tympel et al., “The Next Generation of Cryogenic Current Comparators for Beam Monitoring”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 441-444. |
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V. L. Dorokhov et al., “The New Optical Device for Turn to Turn Beam Profile Measurement”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 593-596. |
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