5th Int. Beam Instrumentation Conf. (IBIC'16)
Barcelona, Spain, Sep. 2016
References
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Reference
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A. A. Tishchenko and D. Yu. Sergeeva, “X-Ray Smith-Purcell Radiation for Non-Invasive Submicron Diagnostics of Electron Beams Having TeV Energy”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 494-497. |
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A. A. Nosych and U. Iriso, “Studies and Historical Analysis of ALBA Beam Loss Monitors”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 94-97. |
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