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6th Int. Beam Instrumentation Conf. (IBIC'17)

Grand Rapids, MI, USA, Aug. 2017

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	Reference
	J. W. Storey et al., “First Results From the Operation of a Rest Gas Ionisation Profile Monitor Based on a Hybrid Pixel Detector”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 318-322.
	J. Wang, D. Mihalcea, and P. Piot, “Time-Resolved Electron-Bunch Diagnostics Using Transverse Wakefields”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 172-175.
	J. Wei et al., “FRIB Project Status and Beam Instrumentation Challenges”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 1-7.
	K. C. Harkay et al., “Characterizing the Coupled Bunch Driving Terms in a Storage Ring”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 21-27.
	K. Hirosawa et al., “New RF Feedback System and Simulations for Suppression of Coupled-Bunch Instabilities at SuperKEKB”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 292-294.
	L. Sabato et al., “RF Deflector Based Measurements of the Correlations Between Vertical and Longitudinal Planes at ELI-NP-GBS Electron LINAC”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 404-407.
	L. W. Lai et al., “The Application of Direct RF Sampling System on Cavity BPM Signal Processing”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 278-280.
	M. Barros Marin et al., “Performance of the AWAKE Proton Beam Line Beam Position Measurement System at CERN”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 209-212.
	M. Cargnelutti et al., “S-Band Cavity BPM Readout Electronics for the ELI-NP Gamma Beam Source”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 243-246.
	M. Caselle et al., “Single-Shot Longitudinal Beam Profile and Terahertz Diagnostics at MHz - Towards GHz-Rates with High-Throughput Electronics”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 136-140.

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