7th Int. Beam Instrumentation Conf. (IBIC'18)
Shanghai, China, Sep. 2018
References
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Reference
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A. A. Nosych, B. Bravo, and U. Iriso, “Energy Loss Measurements with Streak Camera at ALBA”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 548-551. |
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A. De Santis et al., “DA?NE Luminosity Monitor”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 81-84. |
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A. Mariet and R. Veness, “Selection of Wires for the New Generation of Fast Wire Scanners at CERN”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 523-526. |
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A. Potylitsyn, G. Kube, A. I. Novokshonov, and L. G. Sukhikh, “Spatial Resolution Improvement of OTR Monitors by Off-axis Light Collection”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 451-454. |
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A. Pozenel, M. Eichinger, S. Enke, M. F??rtinger, C. Kurf??rst, and M. Repov, “Pin Diode in a Medical Accelerator - a Proof of Principle and Preliminary Measurements”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 208-210. |
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A. Rost, J. Adamczewski-Musch, T. Galatyuk, S. Linev, J. Pietraszko, and M. Traxler, “Beam Quality Monitoring System in the HADES Experiment at GSI Using CVD Diamond Material”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 300-302. |
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A. V. Ottmar, V. Gubin, Yu. I. Maltseva, and T. V. Rybitskaya, “Electron Spectrometer for a Low Charge Intermediate Energy LWFA Electron Beam Measurement”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 57-60. |
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B. G. Freeman, P. E. Evtushenko, J. Gubeli, and K. Jordan, “Experimental Setup of Apodization Techniques for Beam Diagnostics Performed at ELBE”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 482-485. |
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B. Gao, J. Chen, Y. B. Leng, and Y. M. Zhou, “Machine Learning Applied to Predict Transverse Oscillation at SSRF”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 512-515. |
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B. Steffen, M. K. Czwalinna, C. Gerth, and P. Peier, “First Electro-Optical Bunch Length Measurements from the European XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 338-341. |
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