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7th Int. Beam Instrumentation Conf. (IBIC'18)

Shanghai, China, Sep. 2018

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	Reference
	Z. P. Xie, Y. K. Ding, Y. He, Y. M. Li, J. Liang, and H. Liu, “Arc Discharge Detectors for the CiADS Superconducting RF Cavities”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 228-231.
	Y. Zhao, Y. Y. Du, and L. Wang, “Upgrade and Improvement of CT Based on TMR”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 134-136.
	Y. Y. Hu et al., “The Design of Dose Parameter Acquisition and Control System for a Pencil Beam Scanning System in HUST-PTF”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 143-146.
	Y. Petenev et al., “Precise Measurement of Small Currents at the MLS”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 118-121.
	Y. M. Zhou, B. Gao, Y. B. Leng, and N. Zhang, “Injection Transient Study Using 6-Dimensional Bunch-by-bunch Diagnostic System at SSRF”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 542-547.
	Y. H. Lu and J. He, “Virtual Signal Spectrum Analyzer Development Based On RedPitaya and EPICS for Tune Measurement in BEPCII”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 159-161.
	Y. E. Tan and R. B. Hogan, “Australian Synchrotron BPM Electronics Upgrade”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 297-299.
	Y. C. Yu et al., “The Monte Carlo Simulation for the Radiation Protection in a Nozzle of HUST-PTF”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 232-235.
	Y. B. Yan et al., “Data Acquisition System for Beam Instrumentation of SXFEL and DCLS”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 137-139.
	X. Q. Liu, L. F. Hua, L. W. Lai, Y. B. Leng, R. X. Yuan, and N. Zhang, “Electro-Optic Modulator Based Beam Arrival Time Monitor for SXFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 396-399.

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