39th Int. Free Electron Laser Conf. (FEL'19)
Hamburg, Germany, Aug. 2019
References
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Reference
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S. Schulz et al., “Few-Femtosecond Facility-Wide Synchronization of the European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 318-321. |
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A. Berlin et al., “Balanced Optical-Microwave Phase Detector for 800-nm Pulsed Lasers with Sub-Femtosecond Resolution”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 322-324. |
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E. Cano Vargas et al., “Timing Stability Comparison Study of RF Synthesis Techniques”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 325-327. |
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F. Christie, J. R?Ânsch-Schulenburg, and M. Vogt, “A PolariX TDS for the FLASH2 Beamline”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 328-331. |
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M. Felber et al., “Usage of the MicroTCA.4 Electronics Platform for Femtosecond Synchronization Systems”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 332-334. |
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L. Fr?Âhlich et al., “Multi-Beamline Operation at the European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 335-338. |
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R. Kammering, “Long Term Stability and Slow Feedback Performance at the European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 339-342. |
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T. Lamb et al., “Femtosecond Laser-to-RF Synchronization and RF Reference Distribution at the European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 343-345. |
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S. Pfeiffer et al., “Longitudinal Intra-Train Beam-Based Feedback at FLASH”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 346-349. |
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N. M. Lockmann, C. Gerth, B. Schmidt, and S. Wesch, “THz Spectroscopy with MHz Repetition Rates for Bunch Profile Reconstructions at European XFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 350-352. |
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