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39th Int. Free Electron Laser Conf. (FEL'19)

Hamburg, Germany, Aug. 2019


References


Reference
W. K. Lau et al., “An Updated Design of the NSRRC Seeded VUV Free Electron Laser Test Facility”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 651-653.
N. Chaisueb and S. Rimjaem, “Simulation and Optimization of Injector System for the Pre-bunched THz FEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 654-657.
N. Thompson, “XFEL Isochronous Chicanes: Feasibility Study”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 658-660.
Y. Ding, K. L. F. Bane, and Y. M. Nosochkov, “Beam Shaping for High-Repetition-Rate X-Ray FELs”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 661-664.
R. A. Margraf, X. J. Deng, Z. Huang, J. P. MacArthur, and G. Marcus, “Microbunch Rotation for Hard X-Ray Beam Multiplexing”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 665-668.
G. Stupakov, “A Novel One-Dimensional Model for CSR Wakefields”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 669-672.
I. Bahns, W. Hillert, P. Rauer, J. Ro?ƒbach, and H. Sinn, “Interaction of Powerful Electro-Magnetic Fields With Bragg Reflectors”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 673-676.
K. M. Nam, Y. W. Parc, and G. S. Yun, “The Simulation Study for Single and Multi Turn ERL Based EUV FEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 677-679.
A. Y. Molodozhentsev et al., “Laser-Driven Compact Free Electron Laser Development at ELI-Beamlines”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 680-683.
M.-E. Couprie et al., “Progress Towards Laser Plasma Electron Based Free Electron Laser on COXINEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 684-687.

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