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9th Int. Beam Instrumentation Conf. (IBIC'20)

9th International Beam Instrumentation Conference
Santos, Brazil, Sep. 2020

Published Nov 2020
ISBN 978-3-95-450222-6
ISSN 2673-5350


References


Reference
J. L. Sun et al., “Commissioning of the Beam Instrumentation System of CSNS”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 7-10.
J. He and J. H. Yue, “Bunch Purity Measurement and Improvement”, presented at the 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, paper TUPP01, unpublished.
J. H. Yue et al., “Consideration and Design of HEPS Beam Instrumentation”, presented at the 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, paper THPP31, unpublished.
J. Chen et al., “Precise Bunch Charge Measurement Using BPM Pickup”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 21-25.
J. C. Dooling et al., “Diagnostics for Collimator Irradiation Studies in the Advanced Photon Source Storage Ring”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 26-33.
I. V. Konoplev, G. Doucas, and H. Zhang, “Non-Destructive Monitoring of Electron Beam Micro-Bunching Periodicity”, presented at the 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, paper WEPP19, unpublished.
I. Mateu et al., “A Beam Profile Monitor for High Energy Proton Beams Using Microfabrication Techniques”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 86-89.
I. Degl, A. Boccardi, L. Fanucci, and M. Wendt, “Direct Digitization and ADC Parameter Trade-off for Bunch-by-Bunch Signal Processing”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 288-294.
H. O. C. Duarte, S. R. Marques, and D. O. Tavares, “Initial Experiences With Beam Diagnostics During Sirius Commissioning”, presented at the 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, paper MOAO02, unpublished.
H. Maesaka et al., “Design of the Beam Diagnostic System for the New 3 GeV Light Source in Japan”, in Proc. 9th Int. Beam Instrumentation Conf. (IBIC'20), Santos, Brazil, Sep. 2020, pp. 174-178.

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