24th International Workshop on ECR Ion Sources (ECRIS'20)
International Workshop on ECR Ion Sources # series
East Lansing, MI, USA, Sep. 2020
Published Jul 2022
ISBN 978-3-95-450226-4
ISSN 2222-5692
References
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Reference
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L. T. Sun et al., “FECR Ion Source Development and Challenges”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOWZO01, pp. 1-5. |
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C. Qian et al., “LECR5 Development and Status Report”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOWZO02, pp. 6-9. |
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L. Celona et al., “Status of the AISHa Ion Source at INFN-LNS”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOWZO03, pp. 10-12. |
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I. Izotov, A. Bokhanov, E. M. Kiseleva, R. L. Lapin, V. Skalyga, and S. S. Vybin, “GISMO Gasdynamic ECR Ion Source Status: Towards High-Intensity Ion Beams of Superior Quality”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOWZO04, pp. 13-16. |
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D. Z. Xie et al., “Status of the 45 GHz MARS-D ECRIS”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOXZO01, pp. 17-20. |
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O. A. Tarvainen, D. C. Faircloth, J. Julin, T. Kalvas, and A. P. Letchford, “Conceptual Design of Heavy Ion ToF-ERDA Facility Based on Permanent Magnet ECRIS and Variable Frequency RFQ Accelerator”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOXZO02, pp. 21-26. |
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H. T. Ren et al., “FRIB 28 GHz ECR Ion Source Development and Status”, presented at the 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOXZO03, unpublished. |
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R. Rácz et al., “Imaging in X-ray Ranges to Locally Investigate the Effect of the Two-Close-Frequency Heating in ECRIS Plasmas”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOYZO01, pp. 27-31. |
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E. Naselli et al., “High Resolution X-ray Imaging as a Powerful Diagnostics Tool to Investigate ECRIS Plasma Structure and Confinement Dynamics”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOYZO02, pp. 32-37. |
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B. C. Isherwood and G. Machicoane, “The Relationship Between the Diffusion of Hot Electrons, Plasma Stability, and ECR Ion Source Performance”, in Proc. 24th International Workshop on ECR Ion Sources (ECRIS'20), East Lansing, MI, USA, Sep. 2020, paper MOYZO03, pp. 38-42. |
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