Reference Search

Favourites

For Word

[n]	J. L. Turner et al., “Studies of LCLS FEL Divergence”, in Proc. FEL'15, Daejeon, Korea, Aug. 2015, pp. 681-684. doi:10.18429/JACoW-FEL2015-WEP052

[n]	I. Silva Torrecilla et al., “Development of a Pass-Through Diagnostic for Next-Generation XFELs Using Diamond Sensors”, in Proc. IBIC'21, Pohang, Korea, Sep. 2021, pp. 80-83. doi:10.18429/JACoW-IBIC2021-MOPP19

For LaTeX

%\cite{Turner:FEL15-WEP052} \bibitem{Turner:FEL15-WEP052} J. L. Turner \emph{et al.}, \textquotedblleft{Studies of LCLS FEL Divergence}\textquotedblright, in \emph{Proc. FEL’15}, Daejeon, Korea, Aug. 2015, pp. 681--684. \doi{10.18429/JACoW-FEL2015-WEP052} %\cite{Silva Torrecilla:IBIC21-MOPP19} \bibitem{Silva Torrecilla:IBIC21-MOPP19} I. Silva Torrecilla \emph{et al.}, \textquotedblleft{Development of a Pass-Through Diagnostic for Next-Generation XFELs Using Diamond Sensors}\textquotedblright, in \emph{Proc. IBIC’21}, Pohang, Korea, Sep. 2021, pp. 80--83. \doi{10.18429/JACoW-IBIC2021-MOPP19}

For BibTeX

@inproceedings{turner:fel15-wep052, author = {J. L. Turner and others}, title = {{Studies of LCLS FEL Divergence}}, booktitle = {Proc. FEL'15}, pages = {681--684}, paper = {WEP052}, venue = {Daejeon, Korea, Aug. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-FEL2015-WEP052}, url = {https://jacow.org/FEL2015/papers/WEP052.pdf}, language = {english} } @inproceedings{silva torrecilla:ibic21-mopp19, author = {I. Silva Torrecilla and others}, title = {{Development of a Pass-Through Diagnostic for Next-Generation XFELs Using Diamond Sensors}}, booktitle = {Proc. IBIC'21}, pages = {80--83}, paper = {MOPP19}, venue = {Pohang, Korea}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, doi = {10.18429/JACoW-IBIC2021-MOPP19}, url = {https://jacow.org/ibic2021/papers/MOPP19.pdf}, language = {english} }

References

• J. L. Turner et al., “Studies of LCLS FEL Divergence”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 681-684.
• I. Silva Torrecilla et al., “Development of a Pass-Through Diagnostic for Next-Generation XFELs Using Diamond Sensors”, in Proc. 10th Int. Beam Instrumentation Conf. (IBIC'21), Pohang, Korea, Sep. 2021, pp. 80-83.