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For Word

[n]	T. Naito et al., “Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215-217. 

For LaTeX

%\cite{Naito:IBIC12-MOPB63} \bibitem{Naito:IBIC12-MOPB63} T. Naito \emph{et al.}, \textquotedblleft{Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF}\textquotedblright, in \emph{Proc. IBIC’12}, Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215--217.

For BibTeX

@inproceedings{naito:ibic12-mopb63, author = {T. Naito and others}, title = {{Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF}}, booktitle = {Proc. IBIC'12}, pages = {215--217}, paper = {MOPB63}, venue = {Tsukuba, Japan, Oct. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org//IBIC2012/papers/MOPB63.pdf}, language = {english} }

References

• T. Naito et al., “Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215-217.