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[n]	J. Yan, J. Gubeli, K. Jordan, and B. Bailey, “Wire Scanner for High Intensity Beam Profile Diagnostics”, in Proc. ICALEPCS'19, New York, NY, USA, Oct. 2019, pp. 623. doi:10.18429/JACoW-ICALEPCS2019-MOPHA164

[n]	A. Faus-Golfe and J. Le Duff, “A Versatile Lattice for a Tau-Charm Factory That Includes a Monochromatization Scheme (Low Emittance) and a Standard Scheme (High Emittance)”, in Proc. PAC'93, Washington D.C., USA, Mar. 1993, pp. 2045-2048. 

For LaTeX

%\cite{Yan:ICALEPCS19-MOPHA164} \bibitem{Yan:ICALEPCS19-MOPHA164} J. Yan, J. Gubeli, K. Jordan, and B. Bailey, \textquotedblleft{Wire Scanner for High Intensity Beam Profile Diagnostics}\textquotedblright, in \emph{Proc. ICALEPCS’19}, New York, NY, USA, Oct. 2019, pp. 623. \doi{10.18429/JACoW-ICALEPCS2019-MOPHA164} %\cite{Faus-Golfe:PAC93} \bibitem{Faus-Golfe:PAC93} A. Faus-Golfe and J. Le Duff, \textquotedblleft{A Versatile Lattice for a Tau-Charm Factory That Includes a Monochromatization Scheme (Low Emittance) and a Standard Scheme (High Emittance)}\textquotedblright, in \emph{Proc. PAC’93}, Washington D.C., USA, Mar. 1993, pp. 2045--2048.

For BibTeX

@inproceedings{yan:icalepcs19-mopha164, author = {J. Yan and J. Gubeli and K. Jordan and B. Bailey}, title = {{Wire Scanner for High Intensity Beam Profile Diagnostics}}, booktitle = {Proc. ICALEPCS'19}, pages = {623}, paper = {MOPHA164}, venue = {New York, NY, USA}, series = {International Conference on Accelerator and Large Experimental Physics Control Systems}, number = {17}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {10}, year = {2020}, issn = {2226-0358}, isbn = {978-3-95-450209-7}, doi = {10.18429/JACoW-ICALEPCS2019-MOPHA164}, url = {https://jacow.org/icalepcs2019/papers/MOPHA164.pdf}, language = {english} } @inproceedings{faus-golfe:pac93, author = {A. Faus-Golfe and J. Le Duff}, title = {{A Versatile Lattice for a Tau-Charm Factory That Includes a Monochromatization Scheme (Low Emittance) and a Standard Scheme (High Emittance)}}, booktitle = {Proc. PAC'93}, pages = {2045--2048}, paper = {}, venue = {Washington D.C., USA, Mar. 1993}, publisher = {JACoW Publishing, Geneva, Switzerland}, language = {english} }

References

• J. Yan, J. Gubeli, K. Jordan, and B. Bailey, “Wire Scanner for High Intensity Beam Profile Diagnostics”, in Proc. 17th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'19), New York, NY, USA, Oct. 2019, pp. 623.
• A. Faus-Golfe and J. Le Duff, “A Versatile Lattice for a Tau-Charm Factory That Includes a Monochromatization Scheme (Low Emittance) and a Standard Scheme (High Emittance)”, in Proc. 15th Particle Accelerator Conf. (PAC'93), Washington D.C., USA, Mar. 1993, pp. 2045-2048.