[n] S. Sampayan, J. Weir, and R. Richardson, “Elliptical X-Ray Spot Measurement”, in Proc. LINAC'00, Monterey, CA, USA, Aug. 2000, paper MOC07, pp. 161-163.
[n] O. Berrig, D. Lohmann, G. Morpurgo, and H. Schmickler, “Real-time Monitoring of Beam-beam Modes at LEP”, in Proc. EPAC'98, Stockholm, Sweden, Jun. 1998, paper WEP13H, pp. 1568-1570.
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