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[n] S. Biedron et al., “High Energy Heavy Ion Single Event Effects (HE HISEE): Planning for the future of microelectronics”, in Proc. NAPAC'25, Sacramento, California, USA, Aug. 2025, pp. 1034-1037. doi:10.18429/JACoW-NAPAC2025-THP041
[n] S. Franke, W. Ackermann, T. Weiland, C. Klose, M. Platz, and P. A. Görgen, “Further Development of the V-Code for Recirculating Linear Accelerator Simulations”, in Proc. LINAC'10, Tsukuba, Japan, Sep. 2010, paper THP084, pp. 938-940.
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- S. Biedron et al., “High Energy Heavy Ion Single Event Effects (HE HISEE): Planning for the future of microelectronics”, in Proc. 6th North American Particle Accelerator Conference (NAPAC'25), Sacramento, California, USA, Aug. 2025, pp. 1034-1037.
- S. Franke, W. Ackermann, T. Weiland, C. Klose, M. Platz, and P. A. Görgen, “Further Development of the V-Code for Recirculating Linear Accelerator Simulations”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper THP084, pp. 938-940.
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