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[n]	R. M. Thurman-Keup, C. E. Lundberg, D. Slimmer, and J. R. Zagel, “A Study of the Gain of Microchannel Plates in the Ionization Profile Monitors at Fermilab”, in Proc. IBIC'23, Saskatoon, Canada, Sep. 2023, pp. 405-409. doi:10.18429/JACoW-IBIC2023-WEP025

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