[n] R. M. Thurman-Keup, C. E. Lundberg, D. Slimmer, and J. R. Zagel, “A Study of the Gain of Microchannel Plates in the Ionization Profile Monitors at Fermilab”, in Proc. IBIC'23, Saskatoon, Canada, Sep. 2023, pp. 405-409. doi:10.18429/JACoW-IBIC2023-WEP025
Use Complete Form