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[n]	T. J. Campese et al., “Multi-Diagnostic Transverse Profile Monitor Chamber for Extreme Ultraviolet Lithography”, in Proc. IBIC'15, Melbourne, Australia, Sep. 2015, pp. 554-556. doi:10.18429/JACoW-IBIC2015-TUPB085

[n]	D. McNanney et al., “An approachable beam loss monitor configuration and operation tool for FRIB”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 3405-3408. doi:10.18429/JACoW-IPAC2024-THPG61

For LaTeX

%\cite{Campese:IBIC15-TUPB085} \bibitem{Campese:IBIC15-TUPB085} T. J. Campese \emph{et al.}, \textquotedblleft{Multi-Diagnostic Transverse Profile Monitor Chamber for Extreme Ultraviolet Lithography}\textquotedblright, in \emph{Proc. IBIC’15}, Melbourne, Australia, Sep. 2015, pp. 554--556. \doi{10.18429/JACoW-IBIC2015-TUPB085} %\cite{McNanney:IPAC24-THPG61} \bibitem{McNanney:IPAC24-THPG61} D. McNanney \emph{et al.}, \textquotedblleft{An approachable beam loss monitor configuration and operation tool for FRIB}\textquotedblright, in \emph{Proc. IPAC’24}, Nashville, TN, USA, May 2024, pp. 3405--3408. \doi{10.18429/JACoW-IPAC2024-THPG61}

For BibTeX

@inproceedings{campese:ibic15-tupb085, author = {T. J. Campese and others}, title = {{Multi-Diagnostic Transverse Profile Monitor Chamber for Extreme Ultraviolet Lithography}}, booktitle = {Proc. IBIC'15}, pages = {554--556}, paper = {TUPB085}, venue = {Melbourne, Australia, Sep. 2015}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2015-TUPB085}, url = {https://jacow.org/IBIC2015/papers/TUPB085.pdf}, language = {english} } @inproceedings{mcnanney:ipac24-thpg61, author = {D. McNanney and others}, title = {{An approachable beam loss monitor configuration and operation tool for FRIB}}, booktitle = {Proc. IPAC'24}, pages = {3405--3408}, paper = {THPG61}, venue = {Nashville, TN, USA}, series = {International Particle Accelerator Conference}, number = {15}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {7}, year = {2024}, issn = {2673-5490}, isbn = {978-3-95-450247-9}, doi = {10.18429/JACoW-IPAC2024-THPG61}, language = {english} }

References

• T. J. Campese et al., “Multi-Diagnostic Transverse Profile Monitor Chamber for Extreme Ultraviolet Lithography”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 554-556.
• D. McNanney et al., “An approachable beam loss monitor configuration and operation tool for FRIB”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper THPG61, pp. 3405-3408.