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[n]	A. Halavanau et al., “Progress on emittance exchange-based nano-modulation generation”, presented at the IPAC'25, Taipei, Taiwan, Jun. 2025, paper TUPM116, unpublished. 

[n]	B. Dehning, “Review of Reliability Concepts Applied to Beam Loss Monitoring Systems”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper WEIB02, pp. 550-556. 

For LaTeX

%\cite{Halavanau:IPAC25-TUPM116} \bibitem{Halavanau:IPAC25-TUPM116} A. Halavanau \emph{et al.}, \textquotedblleft{Progress on emittance exchange-based nano-modulation generation}\textquotedblright, presented at the IPAC’25, Taipei, Taiwan, Jun. 2025, paper TUPM116, unpublished. %\cite{Dehning:IBIC12-WEIB02} \bibitem{Dehning:IBIC12-WEIB02} B. Dehning, \textquotedblleft{Review of Reliability Concepts Applied to Beam Loss Monitoring Systems}\textquotedblright, in \emph{Proc. IBIC’12}, Tsukuba, Japan, Oct. 2012, paper WEIB02, pp. 550--556.

For BibTeX

@unpublished{halavanau:ipac25-tupm116, author = {A. Halavanau and others}, title = {{Progress on emittance exchange-based nano-modulation generation}}, pages = {}, paper = {TUPM116}, venue = {Taipei, Taiwan, Jun. 2025}, intype = {presented at the}, series = {International Particle Accelerator Conference}, number = {16}, publisher = {JACoW Publishing, Geneva, Switzerland}, note = {presented at IPAC'25, Taipei, Taiwan, Jun. 2025, paper TUPM116, unpublished}, language = {english} } @inproceedings{dehning:ibic12-weib02, author = {B. Dehning}, title = {{Review of Reliability Concepts Applied to Beam Loss Monitoring Systems}}, booktitle = {Proc. IBIC'12}, pages = {550--556}, paper = {WEIB02}, venue = {Tsukuba, Japan, Oct. 2012}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org//IBIC2012/papers/WEIB02.pdf}, language = {english} }

References

• A. Halavanau et al., “Progress on emittance exchange-based nano-modulation generation”, presented at the 16th Int. Particle Accelerator Conf. (IPAC'25), Taipei, Taiwan, Jun. 2025, paper TUPM116, this conference.
• B. Dehning, “Review of Reliability Concepts Applied to Beam Loss Monitoring Systems”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper WEIB02, pp. 550-556.