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[n]	R. Cimino and F. Sch?ñfers, “Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators”, in Proc. IPAC'14, Dresden, Germany, Jun. 2014, pp. 2335-2337. doi:10.18429/JACoW-IPAC2014-WEPME034

[n]	D. Van Winkle, V. A. Dolgashev, J. D. Fox, and S. G. Tantawi, “Investigations into Cost Reductions of X-band Instrumentation”, in Proc. EPAC'08, Genoa, Italy, Jun. 2008, paper TUPP015, pp. 1559-1561. 

[n]	R. Cimino, M. Commisso, T. Demma, D. Grosso, N. Mahne, and A. Giglia, “Experimental Efforts at LNF to Reduce Secondary Electron Yield in Particle Accelerators”, in Proc. ECLOUD'10, Ithaca, NY, USA, Oct. 2010, paper MIT03, pp. 46-49. 

For LaTeX

%\cite{Cimino:IPAC14-WEPME034} \bibitem{Cimino:IPAC14-WEPME034} R. Cimino and F. Sch?ñfers, \textquotedblleft{Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators}\textquotedblright, in \emph{Proc. IPAC’14}, Dresden, Germany, Jun. 2014, pp. 2335--2337. \doi{10.18429/JACoW-IPAC2014-WEPME034} %\cite{Van Winkle:EPAC08-TUPP015} \bibitem{Van Winkle:EPAC08-TUPP015} D. Van Winkle, V. A. Dolgashev, J. D. Fox, and S. G. Tantawi, \textquotedblleft{Investigations into Cost Reductions of X-band Instrumentation}\textquotedblright, in \emph{Proc. EPAC’08}, Genoa, Italy, Jun. 2008, paper TUPP015, pp. 1559--1561. %\cite{Cimino:ECLOUD10-MIT03} \bibitem{Cimino:ECLOUD10-MIT03} R. Cimino, M. Commisso, T. Demma, D. Grosso, N. Mahne, and A. Giglia, \textquotedblleft{Experimental Efforts at LNF to Reduce Secondary Electron Yield in Particle Accelerators}\textquotedblright, in \emph{Proc. ECLOUD’10}, Ithaca, NY, USA, Oct. 2010, paper MIT03, pp. 46--49.

For BibTeX

@inproceedings{cimino:ipac14-wepme034, author = {R. Cimino and F. Sch?ñfers}, title = {{Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators}}, booktitle = {Proc. IPAC'14}, pages = {2335--2337}, paper = {WEPME034}, venue = {Dresden, Germany, Jun. 2014}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IPAC2014-WEPME034}, url = {https://jacow.org/IPAC2014/papers/WEPME034.pdf}, language = {english} } @inproceedings{van winkle:epac08-tupp015, author = {D. Van Winkle and V. A. Dolgashev and J. D. Fox and S. G. Tantawi}, title = {{Investigations into Cost Reductions of X-band Instrumentation}}, booktitle = {Proc. EPAC'08}, pages = {1559--1561}, paper = {TUPP015}, venue = {Genoa, Italy}, series = {European Particle Accelerator Conference}, number = {11}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {7}, year = {2008}, url = {https://jacow.org/e08/papers/TUPP015.pdf}, language = {english} } @inproceedings{cimino:ecloud10-mit03, author = {R. Cimino and M. Commisso and T. Demma and D. Grosso and N. Mahne and A. Giglia}, title = {{Experimental Efforts at LNF to Reduce Secondary Electron Yield in Particle Accelerators}}, booktitle = {Proc. ECLOUD'10}, pages = {46--49}, paper = {MIT03}, venue = {Ithaca, NY, USA, Oct. 2010}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/ECLOUD2010/papers/MIT03.pdf}, language = {english} }

References

• R. Cimino and F. Sch?ñfers, “Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators”, in Proc. 5th Int. Particle Accelerator Conf. (IPAC'14), Dresden, Germany, Jun. 2014, pp. 2335-2337.
• D. Van Winkle, V. A. Dolgashev, J. D. Fox, and S. G. Tantawi, “Investigations into Cost Reductions of X-band Instrumentation”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper TUPP015, pp. 1559-1561.
• R. Cimino, M. Commisso, T. Demma, D. Grosso, N. Mahne, and A. Giglia, “Experimental Efforts at LNF to Reduce Secondary Electron Yield in Particle Accelerators”, in Proc. 49th ICFA Advanced Beam Dynamics Workshop on Electron Cloud Physics (ECLOUD'10), Ithaca, NY, USA, Oct. 2010, paper MIT03, pp. 46-49.