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[n]	A. Veeramani, E. Bjorklund, and T. F. Debelle, “Using EPICS Enabled Industrial Hardware for Upgrading Control Systems”, in Proc. ICALEPCS'09, Kobe, Japan, Oct. 2009, paper WEP078, pp. 555-557. 
[n]	Ye. Ivanisenko, V. Schlott, and P. Peier, “Measurements of Compressed Bunch Temporal Profile using Electro-Optic Monitor at SITF”, in Proc. FEL'14, Basel, Switzerland, Aug. 2014, paper THP082, pp. 922-924. 

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