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[n]	A. Dangwal, D. Reschke, and G. M??ller, “DC Field Emission Scanning Measurements on Electropolished Nb Samples”, in Proc. SRF'05, Ithaca, NY, USA, Jul. 2005, paper TUP11, pp. 255-260. 
[n]	R. Bacher, “Enhancing the Man-Machine-Interface of Accelerator Control Applications with Modern Consumer Market Technologies”, in Proc. ICALEPCS'13, San Francisco, CA, USA, Oct. 2013, paper THCOAAB02, pp. 1044-1047. 

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