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[n]	C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. Cyclotrons'19, Cape Town, South Africa, Sep. 2019, pp. 302-304. doi:10.18429/JACoW-CYCLOTRONS2019-THB04
[n]	S. Blanchard et al., “The Linac4 Vacuum Control System”, in Proc. ICALEPCS'17, Barcelona, Spain, Oct. 2017, pp. 1494-1497. doi:10.18429/JACoW-ICALEPCS2017-THPHA056

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