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[n] C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. Cyclotrons'19, Cape Town, South Africa, Sep. 2019, pp. 302-304. doi:10.18429/JACoW-CYCLOTRONS2019-THB04
[n] S. Blanchard et al., “The Linac4 Vacuum Control System”, in Proc. ICALEPCS'17, Barcelona, Spain, Oct. 2017, pp. 1494-1497. doi:10.18429/JACoW-ICALEPCS2017-THPHA056
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- C. Thiebaux et al., “Development of a Transparent Profiler Based on Secondary Electrons Emission for Charged Particle Beams”, in Proc. 22nd Int. Conf. on Cyclotrons and their Applications (Cyclotrons'19), Cape Town, South Africa, Sep. 2019, pp. 302-304.
- S. Blanchard et al., “The Linac4 Vacuum Control System”, in Proc. 16th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'17), Barcelona, Spain, Oct. 2017, pp. 1494-1497.
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