Reference Search

Favourites

For Word

[n]	J. Kirschner et al., “Bayesian Optimisation for Fast and Safe Parameter Tuning of SwissFEL”, in Proc. FEL'19, Hamburg, Germany, Aug. 2019, pp. 707-710. doi:10.18429/JACoW-FEL2019-THP061

[n]	H. S. Sandberg et al., “Measuring the Beam Profile by Counting Ionization Electrons”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 257-260. doi:10.18429/JACoW-IBIC2019-TUBO04

For LaTeX

%\cite{Kirschner:FEL19-THP061} \bibitem{Kirschner:FEL19-THP061} J. Kirschner \emph{et al.}, \textquotedblleft{Bayesian Optimisation for Fast and Safe Parameter Tuning of SwissFEL}\textquotedblright, in \emph{Proc. FEL’19}, Hamburg, Germany, Aug. 2019, pp. 707--710. \doi{10.18429/JACoW-FEL2019-THP061} %\cite{HSS:IBIC19-TUBO04} \bibitem{HSS:IBIC19-TUBO04} H. S. Sandberg \emph{et al.}, \textquotedblleft{Measuring the Beam Profile by Counting Ionization Electrons}\textquotedblright, in \emph{Proc. IBIC’19}, Malmö, Sweden, Sep. 2019, pp. 257--260. \doi{10.18429/JACoW-IBIC2019-TUBO04}

For BibTeX

@inproceedings{kirschner:fel19-thp061, author = {J. Kirschner and others}, title = {{Bayesian Optimisation for Fast and Safe Parameter Tuning of SwissFEL}}, booktitle = {Proc. FEL'19}, pages = {707--710}, paper = {THP061}, venue = {Hamburg, Germany, Aug. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-FEL2019-THP061}, url = {https://jacow.org/fel2019/papers/THP061.pdf}, language = {english} } @inproceedings{hss:ibic19-tubo04, author = {H. S. Sandberg and others}, title = {{Measuring the Beam Profile by Counting Ionization Electrons}}, booktitle = {Proc. IBIC'19}, pages = {257--260}, paper = {TUBO04}, venue = {Malmö, Sweden, Sep. 2019}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2019-TUBO04}, url = {https://jacow.org/ibic2019/papers/TUBO04.pdf}, language = {english} }

References

• J. Kirschner et al., “Bayesian Optimisation for Fast and Safe Parameter Tuning of SwissFEL”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 707-710.
• H. S. Sandberg et al., “Measuring the Beam Profile by Counting Ionization Electrons”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 257-260.