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[n]	J. G. Lopes, F. A. Corr?¬a Alegria, L. M. Redondo, and J. Rocha, “High Resolution Ion Beam Profile Measurement System”, in Proc. ICALEPCS'11, Grenoble, France, Oct. 2011, paper MOPKS003, pp. 164-167. 
[n]	T. Tajima et al., “Studies on the Effect of Coating Nb with Thin Layers of Another Superconductor such as NbN and MgB2”, in Proc. PAC'09, Vancouver, Canada, May 2009, paper WE5PFP038, pp. 2079-2079. 

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