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[n]	A. Dangwal, D. Reschke, and G. M??ller, “DC Field Emission Scanning Measurements on Electropolished Nb Samples”, in Proc. SRF'05, Ithaca, NY, USA, Jul. 2005, paper TUP11, pp. 255-260. 

For LaTeX

%\cite{Dangwal:SRF05-TUP11} \bibitem{Dangwal:SRF05-TUP11} A. Dangwal, D. Reschke, and G. M??ller, \textquotedblleft{DC Field Emission Scanning Measurements on Electropolished Nb Samples}\textquotedblright, in \emph{Proc. SRF’05}, Ithaca, NY, USA, Jul. 2005, paper TUP11, pp. 255--260.

For BibTeX

@inproceedings{dangwal:srf05-tup11, author = {A. Dangwal and D. Reschke and G. M??ller}, title = {{DC Field Emission Scanning Measurements on Electropolished Nb Samples}}, booktitle = {Proc. SRF'05}, pages = {255--260}, paper = {TUP11}, venue = {Ithaca, NY, USA, Jul. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2005/papers/TUP11.pdf}, language = {english} }

References

• A. Dangwal, D. Reschke, and G. M??ller, “DC Field Emission Scanning Measurements on Electropolished Nb Samples”, in Proc. 12th Int. Conf. RF Superconductivity (SRF'05), Ithaca, NY, USA, Jul. 2005, paper TUP11, pp. 255-260.