JaCoW Logo

Reference Search

Favourites


For Word

[n]	C. Huang et al., “Monte-Carlo photoemission model for thin film semiconductors under high fields”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 2097-2100. doi:10.18429/JACoW-IPAC2024-WEPC58
[n]	R. Maier et al., “Non-Beam Disturbing Diagnostics at COSY-Juelich”, in Proc. EPAC'90, Nice, France, Jun. 1990, pp. 800-803. 

For LaTeX

Use Complete Form

For BibTeX

References

Back to search