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[n] C. Huang et al., “Monte-Carlo photoemission model for thin film semiconductors under high fields”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 2097-2100. doi:10.18429/JACoW-IPAC2024-WEPC58
[n] R. Maier et al., “Non-Beam Disturbing Diagnostics at COSY-Juelich”, in Proc. EPAC'90, Nice, France, Jun. 1990, pp. 800-803.
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References
- C. Huang et al., “Monte-Carlo photoemission model for thin film semiconductors under high fields”, in Proc. 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper WEPC58, pp. 2097-2100.
- R. Maier et al., “Non-Beam Disturbing Diagnostics at COSY-Juelich”, in Proc. 2nd European Particle Accelerator Conf. (EPAC'90), Nice, France, Jun. 1990, pp. 800-803.
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