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[n]	R. Heuer, T. W. Debiak, J. Porter, and I. Birnbaum, “An Electrostatic Sweep Plate Device for Emittance Measurement of Ion Beams to 2 MeV”, in Proc. PAC'93, Washington D.C., USA, Mar. 1993, pp. 2420-2423. 
[n]	A. H. Lumpkin, W. J. Berg, and B. X. Yang, “Planned Optical Diagnostics for the APS Low-Energy Undulator Test Line”, in Proc. PAC'97, Vancouver, Canada, May 1997, paper 3V019, pp. 871-873. 

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