[n] J. Bosser et al., “The Micron Wire Scanner at the SPS”, in Proc. PAC'87, Washington D.C., USA, Mar. 1987, pp. 783-786.
[n] D. P. Jin et al., “EXPERIMENTAL BACKGROUND STUDY IN THE BEPCII/BESIII”, in Proc. Factories'08, Novosibirsk, Russia, Apr. 2008, paper TUACH08, pp. XX-XX.
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