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Some papers have malformed authors, please correct this before using these references.

The page numbers for some of these references could not be added automatically. You must provide the page numbers from the original proceedings which is located at JACoW.org, and substitute ‘pp. XX-XX’ with the correct page numbers.

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For Word

[n]	Choi H., Baang S., Baek S.H., Chang Y.B., Kim K., Kim Y.J., Kim S.B., Kim M.K., Kim J.H., Kim J.S., Lee S.I., Lee Y.H., Lim B.S., Park H.K., Park K.R., Yee J., Yoon C.S., “Data Acquisition and Control System for Samsung Superconductor Test Facility”, in Proc. ICALEPCS'99, Trieste, Italy, Oct. 1999, paper TC1P70, pp. XX-XX.

[n]	Peryt W., Boucham A., Bouvier S., Drancourt C., Erazmus B., Grabski J., Janik M., Pery P., Radomski S., Stepien P., Szarwas P., “Test Bench for Silicon Strip Detectors Testing”, in Proc. ICALEPCS'99, Trieste, Italy, Oct. 1999, paper TC1P67, pp. XX-XX.

For LaTeX

%\cite{Choi H.:ICALEPCS99-TC1P70} \bibitem{Choi H.:ICALEPCS99-TC1P70} Choi H., Baang S., Baek S.H., Chang Y.B., Kim K., Kim Y.J., Kim S.B., Kim M.K., Kim J.H., Kim J.S., Lee S.I., Lee Y.H., Lim B.S., Park H.K., Park K.R., Yee J., Yoon C.S., \textquotedblleft{Data Acquisition and Control System for Samsung Superconductor Test Facility}\textquotedblright, in \emph{Proc. ICALEPCS’99}, Trieste, Italy, Oct. 1999, paper TC1P70, pp. XX--XX. %\cite{Peryt W.:ICALEPCS99-TC1P67} \bibitem{Peryt W.:ICALEPCS99-TC1P67} Peryt W., Boucham A., Bouvier S., Drancourt C., Erazmus B., Grabski J., Janik M., Pery P., Radomski S., Stepien P., Szarwas P., \textquotedblleft{Test Bench for Silicon Strip Detectors Testing}\textquotedblright, in \emph{Proc. ICALEPCS’99}, Trieste, Italy, Oct. 1999, paper TC1P67, pp. XX--XX.

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For BibTeX

@inproceedings{choi h.:icalepcs99-tc1p70, author = {Choi H. and Baang S. and Baek S.H. and Chang Y.B. and Kim K. and Kim Y.J. and Kim S.B. and Kim M.K. and Kim J.H. and Kim J.S. and Lee S.I. and Lee Y.H. and Lim B.S. and Park H.K. and Park K.R. and Yee J. and Yoon C.S.}, title = {{Data Acquisition and Control System for Samsung Superconductor Test Facility}}, booktitle = {Proc. ICALEPCS'99}, paper = {TC1P70}, venue = {Trieste, Italy, Oct. 1999}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/ica99/papers/TC1P70.pdf}, language = {english} } @inproceedings{peryt w.:icalepcs99-tc1p67, author = {Peryt W. and Boucham A. and Bouvier S. and Drancourt C. and Erazmus B. and Grabski J. and Janik M. and Pery P. and Radomski S. and Stepien P. and Szarwas P.}, title = {{Test Bench for Silicon Strip Detectors Testing}}, booktitle = {Proc. ICALEPCS'99}, paper = {TC1P67}, venue = {Trieste, Italy, Oct. 1999}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/ica99/papers/TC1P67.pdf}, language = {english} }

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