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[n]	L. G. Sukhikh, G. Kube, A. Potylitsyn, S. A. Strokov, and K. Wittenburg, “Grating Scanner for Measurement of Micron-size Beam Profiles”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 448-450. doi:10.18429/JACoW-IBIC2018-WEPB10

For LaTeX

%\cite{Sukhikh:IBIC18-WEPB10} \bibitem{Sukhikh:IBIC18-WEPB10} L. G. Sukhikh, G. Kube, A. Potylitsyn, S. A. Strokov, and K. Wittenburg, \textquotedblleft{Grating Scanner for Measurement of Micron-size Beam Profiles}\textquotedblright, in \emph{Proc. IBIC’18}, Shanghai, China, Sep. 2018, pp. 448--450. \url{doi:10.18429/JACoW-IBIC2018-WEPB10}

For BibTeX

@inproceedings{sukhikh:ibic18-wepb10, author = {L. G. Sukhikh and G. Kube and A. Potylitsyn and S. A. Strokov and K. Wittenburg}, title = {{Grating Scanner for Measurement of Micron-size Beam Profiles}}, booktitle = {Proc. IBIC'18}, pages = {448--450}, paper = {WEPB10}, venue = {Shanghai, China, Sep. 2018}, publisher = {JACoW Publishing, Geneva, Switzerland}, doi = {10.18429/JACoW-IBIC2018-WEPB10}, url = {https://jacow.org/IBIC2018/papers/WEPB10.pdf}, language = {english} }

References

• L. G. Sukhikh, G. Kube, A. Potylitsyn, S. A. Strokov, and K. Wittenburg, “Grating Scanner for Measurement of Micron-size Beam Profiles”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 448-450.