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[n]	B. X. Yang, S. H. Lee, J. W. Morgan, and H. Shang, “High-Energy X-Ray Pinhole Camera for High-Resolution Electron Beam Size Measurements”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 504-507. doi:10.18429/JACoW-IBIC2016-TUPG66

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Paper Title: High-Energy X-Ray Pinhole Camera for High-Resolution Electron Beam Size Measurements
Paper URL: https://jacow.org/ibic2016/papers/TUPG66.pdf
Conference: 5th Int. Beam Instrumentation Conf. (IBIC'16)
Paper ID: TUPG66
Location in proceedings: 504-507
Original Author String: B.X. Yang, S.H. Lee, J.W. Morgan, H. Shang [ANL, Argonne, Illinois, USA]

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