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[n]	A. D. Palczewski, D. Gonnella, O. S. Melnychuk, and D. A. Sergatskov, “Study of Flux Trapping Variability between Batches of Tokyo Denkai Niobium used for the LCLS-II Project and Subsequent 9-cell RF Loss Distribution between the Batches”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 570-575. doi:10.18429/JACoW-SRF2019-TUP057

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Paper Title: Study of Flux Trapping Variability between Batches of Tokyo Denkai Niobium used for the LCLS-II Project and Subsequent 9-cell RF Loss Distribution between the Batches
Paper URL: https://jacow.org/srf2019/papers/TUP057.pdf
Conference: 19th Int. Conf. RF Superconductivity (SRF'19)
Paper ID: TUP057
Location in proceedings: 570-575
Original Author String: A. D. Palczewski,D. Gonnella,O. S. Melnychuk,D. A. Sergatskov

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