[n] D. R. Bett et al., “A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines”, in Proc. IPAC'21, Campinas, Brazil, May 2021, pp. 1382-1385. doi:10.18429/JACoW-IPAC2021-TUPAB020
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Paper Title: A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines
Paper URL: https://jacow.org/ipac2021/papers/TUPAB020.pdf
Conference: 12th Int. Particle Accelerator Conf. (IPAC'21)
Paper ID: TUPAB020
Location in proceedings: 1382-1385
Original Author String: D. R. Bett,P. Burrows,K. Kubo,T. Okugi,C. Perry,R. L. Ramjiawan,N. Terunuma