[n] I. Silva Torrecilla et al., “Development of a Pass-Through Diagnostic for Next-Generation XFELs Using Diamond Sensors”, in Proc. IBIC'21, Pohang, Korea, Sep. 2021, pp. 80-83. doi:10.18429/JACoW-IBIC2021-MOPP19
Use Complete Form
Paper Title: Development of a Pass-Through Diagnostic for Next-Generation XFELs Using Diamond Sensors
Paper URL: https://jacow.org/ibic2021/papers/MOPP19.pdf
Conference: 10th Int. Beam Instrumentation Conf. (IBIC'21)
Paper ID: MOPP19
Location in proceedings: 80-83
Original Author String: I. Silva Torrecilla,J. Bohon,E. Gonzalez,C. T. Harris,B. T. Jacobson,S. Kachiguine,D. Kim,J. P. MacArthur,F. Martinez-Mckinney,S. M. Mazza,M. Nizam,N. P. Norvell,R. Padilla,E. K. Potter,E. Ryan,B. A. Schumm,J. Smedley,M. Tarka,M. Wilder,D. Zhu