Reference Search

Warning
There is a problem with this papers authors.

Reference

For Word

[n]	S. Ma, A. Arnold, A. A. Ryzhov, J. Schaber, J. Teichert, and R. Xiang, “The Applications of Machine Learning in Slit Scan Emittance Measurements”, presented at the IBIC'21, Pohang, Korea, Sep. 2021, paper TUPP01, unpublished.

For LaTeX

%\cite{SMa:IBIC21-TUPP01} \bibitem{SMa:IBIC21-TUPP01} S. Ma, A. Arnold, A. A. Ryzhov, J. Schaber, J. Teichert, and R. Xiang, \textquotedblleft{The Applications of Machine Learning in Slit Scan Emittance Measurements}\textquotedblright, presented at the IBIC’21, Pohang, Korea, Sep. 2021, paper TUPP01, unpublished.

For BibTeX

@unpublished{sma:ibic21-tupp01, author = {S. Ma and A. Arnold and A. A. Ryzhov and J. Schaber and J. Teichert and R. Xiang}, title = {{The Applications of Machine Learning in Slit Scan Emittance Measurements}}, booktitle = {Proc. IBIC'21}, pages = {}, paper = {TUPP01}, venue = {Pohang, Korea}, intype = {presented at the}, series = {International Beam Instrumentation Conference}, number = {10}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2021}, issn = {2673-5350}, isbn = {978-3-95-450230-1}, note = {presented at IBIC'21, Pohang, Korea, Sep. 2021, paper TUPP01, unpublished}, language = {english} }

Use Complete Form

Metadata

Paper Title: The Applications of Machine Learning in Slit Scan Emittance Measurements
Conference: 10th Int. Beam Instrumentation Conf. (IBIC'21)
Paper ID: TUPP01
Original Author String: S. Ma,A. Arnold,A. A. Ryzhov,J. Schaber,J. Teichert,R. Xiang

Associated Authors

Back to the list