[n] C.-J. Jing et al., “Demonstration of a Tunable Electron Beam Chopper for Application in 200 kV stroboscopic TEM”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 467-469. doi:10.18429/JACoW-IPAC2018-MOPML030
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Paper Title: Demonstration of a Tunable Electron Beam Chopper for Application in 200 kV stroboscopic TEM
Paper URL: http://accelconf.web.cern.ch/ipac2018/papers/MOPML030.pdf
Conference: 9th Int. Particle Accelerator Conf. (IPAC'18)
Paper ID: MOPML030
Location in proceedings: 467-469
Original Author String: C.-J. Jing, S.V. Baryshev, A. Kanareykin, A. Liu, Y. Zhao [Euclid TechLabs, LLC, Solon, Ohio, USA] J.W. Lau [NIST, Gaithersburg, Maryland, USA] D. Masiel, B. Reed [Integrated Dynamic Electron Solutions, Pleasanton, California, USA] Y. Zhu [BNL, Upton, Long Island, New York, USA]