[n] H. Ito et al., “Lower Critical Field Measurement System of Thin Film Superconductor”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 3882-3884. doi:10.18429/JACoW-IPAC2018-THPAL105
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Paper Title: Lower Critical Field Measurement System of Thin Film Superconductor
Paper URL: http://accelconf.web.cern.ch/ipac2018/papers/THPAL105.pdf
Conference: 9th Int. Particle Accelerator Conf. (IPAC'18)
Paper ID: THPAL105
Location in proceedings: 3882-3884
Original Author String: H. Ito [Sokendai, Ibaraki, Japan] C.Z. Antoine [CEA/IRFU, Gif-sur-Yvette, France] A. Four [CEA/DRF/IRFU, Gif-sur-Yvette, France] H. Hayano, T. Kubo, T. Saeki [KEK, Ibaraki, Japan] R. Ito, T. Nagata [ULVAC, Inc, Chiba, Japan] Y. Iwashita, R. Katayama, H. Tongu [Kyoto ICR, Uji, Kyoto, Japan] H. Oikawa [Utsunomiya University, Utsunomiya, Japan]