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[n]	Y. X. Zhang, X. Q. Ge, S. W. Wang, Y. Wang, W. Wei, and B. Zhang, “Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film”, in Proc. IPAC'18, Vancouver, Canada, Apr.-May 2018, pp. 4980-4982. doi:10.18429/JACoW-IPAC2018-THPML128

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Paper Title: Production and Secondary Electron Yield Test of Amorphous Carbon Thin Film
Paper URL: http://accelconf.web.cern.ch/ipac2018/papers/THPML128.pdf
Conference: 9th Int. Particle Accelerator Conf. (IPAC'18)
Paper ID: THPML128
Location in proceedings: 4980-4982
Original Author String: Y.X. Zhang, X.Q. Ge, S.W. Wang, Y. Wang, W. Wei, B. Zhang [USTC/NSRL, Hefei, Anhui, People's Republic of China]

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