[n] J. I. Mann et al., “Simulations of Nanoblade Cathode Emissions with Image Charge Trapping for Yield and Brightness Analyses”, in Proc. NAPAC'22, Albuquerque, NM, USA, Aug. 2022, pp. 535-538. doi:10.18429/JACoW-NAPAC2022-TUPA86
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Paper Title: Simulations of Nanoblade Cathode Emissions with Image Charge Trapping for Yield and Brightness Analyses
Paper URL: https://jacow.org/napac2022/papers/TUPA86.pdf
Conference: North American Particle Accelerator Conf. (NAPAC'22)
Paper ID: TUPA86
Location in proceedings: 535-538
Original Author String: J. I. Mann,T. Arias,S. S. Karkare,G. E. Lawler,J. K. Nangoi,J. B. Rosenzweig,B. Wang