[n] J. H. Tan et al., “High Power Test of SINAP X-Band Deflector at KEK”, in Proc. IPAC'17, Copenhagen, Denmark, May 2017, pp. 4251-4253. doi:10.18429/JACoW-IPAC2017-THPIK068
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Paper Title: High Power Test of SINAP X-Band Deflector at KEK
Paper URL: https://jacow.org/ipac2017/papers/THPIK068.pdf
Conference: 8th Int. Particle Accelerator Conf. (IPAC'17)
Paper ID: THPIK068
Location in proceedings: 4251-4253
Original Author String: J.H. Tan, W. Fang, Q. Gu, X.X. Huang, Z.B. Li, Z.T. Zhao [SINAP, Shanghai, People's Republic of China] T. Higo [KEK, Ibaraki, Japan] D.C. Tong [TUB, Beijing, People's Republic of China]