[n] T. E. Oseroff, M. Liepe, and Z. Sun, “Sample Test Systems for Next-Gen SRF Surfaces”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 357. doi:10.18429/JACoW-SRF2021-TUOFDV07
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Paper Title: Sample Test Systems for Next-Gen SRF Surfaces
Paper URL: https://jacow.org/srf2021/papers/TUOFDV07.pdf
Conference: 20th Int. Conf. RF Superconductivity (SRF'21)
Paper ID: TUOFDV07
Location in proceedings: 357
Original Author String: T.E. Oseroff, M. Liepe, Z. Sun