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[n]	Z. Sun, M. Liepe, T. E. Oseroff, and X. Deng, “Characterization of Atomic-Layer-Deposited NbTiN and NbTiN/AlN Films for SIS Multilayer Structures”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 662. doi:10.18429/JACoW-SRF2021-WEPTEV012

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Paper Title: Characterization of Atomic-Layer-Deposited NbTiN and NbTiN/AlN Films for SIS Multilayer Structures
Paper URL: https://jacow.org/srf2021/papers/WEPTEV012.pdf
Conference: 20th Int. Conf. RF Superconductivity (SRF'21)
Paper ID: WEPTEV012
Location in proceedings: 662
Original Author String: Z. Sun, M. Liepe, T.E. Oseroff, X. Deng

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