[n] H. Maesaka et al., “Electron Beam Diagnostic System for the Japanese XFEL, SACLA”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOIC02, pp. 38-46.
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Paper Title: Electron Beam Diagnostic System for the Japanese XFEL, SACLA
Paper URL: https://jacow.org//IBIC2012/papers/MOIC02.pdf
Conference: 1st Int. Beam Instrumentation Conf. (IBIC'12)
Paper ID: MOIC02
Location in proceedings: 38-46
Original Author String: H. Maesaka, H. Ego, C. Kondo, T. Ohshima, Y. Otake, H. Tomizawa [RIKEN SPring-8 Center, Sayo-cho, Sayo-gun, Hyogo, Japan] S. Matsubara, T. Matsumoto, K. Yanagida [JASRI/SPring-8, Hyogo, Japan]
