[n] T. Naito et al., “Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOPB63, pp. 215-217.
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Paper Title: Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF
Paper URL: https://jacow.org//IBIC2012/papers/MOPB63.pdf
Conference: 1st Int. Beam Instrumentation Conf. (IBIC'12)
Paper ID: MOPB63
Location in proceedings: 215-217
Original Author String: T. Naito, H. Hayano, K. Kubo, S. Kuroda, N. Nakamura, T. Okugi, H. Sakai, N. Terunuma, J. Urakawa [KEK, Ibaraki, Japan]
