[n] R. J. Steinhagen, M. J. Boland, T. G. Lucas, R. P. Rassool, and T. M. Mitsuhashi, “Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper MOPC20, pp. 97-100.
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Paper Title: Application of Metal-Semiconductor-Metal (MSM) Photodetectors for Transverse and Longitudinal Intra-Bunch Beam Diagnostics
Paper URL: https://jacow.org/IBIC2013/papers/MOPC20.pdf
Conference: 2nd Int. Beam Instrumentation Conf. (IBIC'13)
Paper ID: MOPC20
Location in proceedings: 97-100
Original Author String: R.J. Steinhagen [CERN, Geneva, Switzerland] M.J. Boland [SLSA, Clayton, Australia] T.G. Lucas, R.P. Rassool [The University of Melbourne, Melbourne, Australia] T.M. Mitsuhashi [KEK, Ibaraki, Japan]
