[n] C. A. Thomas, G. Rehm, F. Ewald, and J. W. Flanagan, “Large Aperture X-ray Monitors for Beam Profile Diagnostics”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper WEAL1, pp. 608-614.
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Paper Title: Large Aperture X-ray Monitors for Beam Profile Diagnostics
Paper URL: https://jacow.org/IBIC2013/papers/WEAL1.pdf
Conference: 2nd Int. Beam Instrumentation Conf. (IBIC'13)
Paper ID: WEAL1
Location in proceedings: 608-614
Original Author String: C.A. Thomas, G. Rehm [Diamond, Oxfordshire, United Kingdom] F. Ewald [ESRF, Grenoble, France] J.W. Flanagan [KEK, Ibaraki, Japan]