[n] K. O. Kruchinin et al., “Extremely Low Emittance Beam Size Diagnostics with Sub-Micrometer Resolution Using Optical Transition Radiation”, in Proc. IBIC'13, Oxford, UK, Sep. 2013, paper WEAL2, pp. 615-618.
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Paper Title: Extremely Low Emittance Beam Size Diagnostics with Sub-Micrometer Resolution Using Optical Transition Radiation
Paper URL: https://jacow.org/IBIC2013/papers/WEAL2.pdf
Conference: 2nd Int. Beam Instrumentation Conf. (IBIC'13)
Paper ID: WEAL2
Location in proceedings: 615-618
Original Author String: K.O. Kruchinin, S.T. Boogert, P. Karataev, L.J. Nevay [Royal Holloway, University of London, Surrey, United Kingdom] A.S. Aryshev, M.V. Shevelev, N. Terunuma, J. Urakawa [KEK, Ibaraki, Japan] B. Bolzon [The University of Liverpool, Liverpool, United Kingdom] B. Bolzon, T. Lefevre (T. Lef?¿vre), S. Mazzoni [CERN, Geneva, Switzerland]
